Material Analysis and Microscopy

Our range of services in materialography:

• Comprehensive microstrcture analysis
• Roughness measurement
• Hardness testing
• Quantitative determination of chemical composition
• Definition of microstructure phases and phase proportions 
• Particle size and proportion measurements 
• Grain size and grain size distribution measurements
• Layer thickness measurement (cross-section) 
• Dendrite arm distance measurements
• Spherical and lamellar graphite analysis

Light microscopy forms the basis of all materialographic characterization. It provides a quick overview of the microstructure of materials and serves as the basis for further analysis. With our state-of-the-art laser scanning microscope, we not only capture detailed images, but also height information — and thus precise 3D data. This allows us to reliably measure and evaluate roughness and topographical structures, for example.

Our scanning electron microscope (SEM) enables high resolution down to the sub-nm range for the investigation of:

• Precipitates and inclusions
• Layer systems
• Grain sizes
• Pores and other sub-µm structures

The focused ion beam (FIB) in our SEM expands our repertoire with the following possibilities:

• Creation of near-surface cross-sections (watch example video) 
• Characterization of thin films and layer systems
• Production of STEM and APT samples
• 3D representation and reconstruction of microstructures

Additional built-in systems enable us to perform a holistic evaluation: 

• Chemical analysis with EDS: particles, layers, or element distributions
• EBSD: analysis of crystal orientations, grain size distributions, dislocation densities, textures, deformations, and preferred directions
• Reconstruction of former austenite grains from EBSD data
  Examination and chemical analysis with STEM and STEM-EDS: Precipitates, phases, and layers down to the sub-nm range
• Special micromachining solutions: Locally resolved repairs, production of precise mask geometries and special mechanical components, targeted deposition of conductive and non-conductive compounds (watch example video)

For quality control, process monitoring, or confusion checks, we determine the chemical composition of materials quickly and precisely — down to the lower ppm range. With our fully equipped spark spectrometry, we analyze a wide range of alloys, including iron (including low- and high-alloy steels and cast iron), aluminum, copper, nickel, titanium, cobalt, tin, zinc, lead, and magnesium.

Due to their diversity and precision, integral X-ray diffraction analysis methods are among the most important methods for phase-specific material characterization. Our XRD systems (PANalytical Xpert Pro MPD and Empyrean) enable:

• Qualitative and quantitative phase determination
• Analysis of crystalline structures (lattice constant, interplanar spacing)
• Investigation of amorphous phases
• Analysis of lattice defects, dislocation density, and stoichiometry
• Residual stress analysis: Qualitative and quantitative determination of manufacturing- and application-related near-surface residual stresses
• Texture analysis: Detection of preferred orientations of crystallites on surfaces and coatings

With special optics, we also offer:

• Grain size analysis of nanocrystalline materials
• Thin film characterization (thickness, quality, deformation state)
• Single crystal measurement and perfection analysis
• State-of-the-art phase analyses with low background noise

Our built-in high-temperature chamber enables phase analyses up to 1200°C in a vacuum or protective gas atmosphere with local resolution of up to 50 µm.

By removing layers using FIB-REM technology, we reconstruct precise 3D structures to visualize the shape, size, distribution, and connectivity of different phases