Surface functionalization
The surface of a material often plays a special role for its later use, whether due to protective effects by coatings or modified properties by selected structures.
In addition to high-resolution imaging and chemical analysis of surfaces, we also offer profile imaging to determine layer systems by means of FIB cross-section. In addition to the possibility of tribological and electrical characterization of a surface, we can also selectively change properties using the laser structuring technique xDLIP.
Direct Laser Interference Patterning (DLIP)
In DLIP (Direct Laser Interference Patterning), high-energy pulsed laser beams are superimposed to produce defined intensity distributions and thus surface topographies with a precise lateral structure size, the structure period (from the upper sub-µm to the two-digit µm range). The exact distribution of the laser intensity can be set in a defined way by the number of combined beams as well as their angles among each other.
The possible applications of this technique are wide-ranging.
- Friction and wear: Reduction of friction by up to 80%, wear by up to 99%.
- Electrical systems: Reduction of electrical contact resistance by up to 80%, insertion force by up to 40%.
- Absorption: Increase in solar absorption by up to 35%.
- Wetting: Structuring of superhydrophilic and superhydrophobic surfaces.
- Medical technology: Reduction in bacterial adhesion by up to 80%.
- Optical design: Customization and protection against counterfeiting with interference colors.
This technology has great potential, for example, in the control of tribological effects. By means of DLIP, a significant reduction of friction and contact areas can be achieved or the service life of lubricating films can be extended manyfold.
The tribological properties can then be assessed on a micro- or nanotribometer. On both devices, we determine friction and wear values of tribologically stressed material pairings.
Further materials engineering development with DLIP takes place at MECS, with future industrializations being carried out by SurFunction GmbH, which was spun off in 2020.
In 2016, the development of the DLIP system was awarded what is probably the most important innovation prize in the field of lasers, and our subsequent successful industrial transfer with TE Connectivity GmbH was awarded the Steinbeis Foundation Transfer Prize in 2019.
Precise measurement of electrical contact and transition resistances
Our test benches enable us to reliably determine electrical contact and transition resistances under variable environmental conditions. This setup is particularly advantageous for your connectors, as it allows simultaneous measurement of transition resistance, insertion force, and friction coefficient.
High-resolution microscopy: FIB-REM, EDS, EBSD
Our scanning electron microscope with built-in focused ion beam and additional measuring systems enables precise examination of your surfaces down to the sub-nm range.
All measurement methods can be found under Microscopy.
CSM Instruments Mikrotribometer
Spectra Physics Nd: YAG ns-Pulslaser
Electrical contact resistance (ECR)
With the help of various test benches, we can reliably determine electrical contact or transition resistances under variable environmental conditions. This setup is interesting for connectors, for example, as it enables parallel measurement of contact resistance, mating force and coefficient of friction (see Triboelectrical Applications).
Contact for questions
Dr.-Ing Dominik Britz
Chief Executive Officer
Dr.-Ing. Tobias Fox
Chief Operating Officer
Further areas of application
AI and Machine Learning
Our services range from feasibility studies with our various approaches to exploratory data analysis with unsupervised ML.
Correlative microscopy
A correlative characterisation of microstructures serves as a benchmark for automated microstructure recognition and as a starting point for machine learning approaches.
Failure analysis
In the area of failure analysis, in addition to identifying and analyzing causes of fracture, we are also able to fully characterize components on both the macro and micro scales.
Triboelectrical characterization
Complementary to our microstructure analysis, we can perform a wide variety of triboelectric measurements under controlled conditions.
Material Analysis and Microscopy
From chemical analyses, microstructural investigations and texture analyses to high-resolution 3D tomography in the nanometer range.
Have we sparked your interest in working together?
Please feel free to contact us! We look forward to talking to you and finding out together how we can help you with your project.