Microscopy

The microstructure knows everything. It stores the previous manufacturing route in its structure and specifies the properties of a component. To gain access to this knowledge, we can prepare, contrast and analyze materials in a wide variety of ways and with great precision. In addition to the entire range of metallographic preparation options, we have light, laser scanning and scanning electron microscopes at our disposal for this purpose.

Materialography

With the help of our materialography laboratory, which is optimally equipped in terms of preparation and analysis, we enable optimum sample extraction with subsequent target-dependent preparation and electrochemical etching of the microstructure. In addition to several cutting and grinding machines, we also have special equipment for vibration and electropolishing.

The visualization of the microstructure is then performed with one of our light and laser scanning microscopes. The latter is additionally used for high-precision determination of 3D surface characteristics such as roughness or texture with a height resolution down to 10 nm.

Click on the slideshow to enlarge the images

The following material characterization can be carried out by us:

Microstructure evaluations including control of heat treatments, segregations and precipitations
Roughness measurements
Hardness measurements

Quantitative microstructure and image analysis can give access to additional information:

Phase fractions
Particle sizes and particle proportions
Grain sizes and grain size distributions
Layer thicknesses
Dendrite arm spacings
Spheroidal graphite analysis
Lamellar graphite analysis

ThEtching

By using ThEtching, developed in collaboration with Cloeren Technologies, we can control microstructural contrasting in a targeted manner, follow it live on screen and record it. Staggered etching reactions can thus be continuously visualized and evaluated in a process.

You can see sample visualizations in the following video clips:

carbon steel thread
globular gray cast iron
laser welded globular gray cast iron

Analysis FIB-REM + EDX/ EBSD

Due to the high resolution down to the sub-nm range, the SEM is our standard tool for the investigation of:

Precipitates and inclusions
Layer systems
Grain sizes
Pores and other sub-µm structures

The combination of FIB and SEM adds the following capabilities to our repertoire:

Generation of near-surface cross sections (view example video)
Characterization of thin films and layer systems
Preparation of STEM and APT samples
3D representation and calculation of microstructures

Additional built-in systems allow us to perform a holistic assessment:

Chemical analysis of particles, layers or element distributions (EDX)
Analysis of crystal orientations, grain size distributions, dislocation densities, textures, deformations and preferred directions (EBSD)
Reconstruction of former austenite grains from EBSD data
Investigation and chemical analysis of precipitates, phases and layers down to the sub-nm range (STEM incl. STEM-EDX)
Locally resolved repairs, production of precise mask geometries and special mechanical components, targeted deposition of conductive and non-conductive compounds (micromachining) (view example video)

Hydrogen Embrittlement

STEM-Analysis

Layer Thickness Analysis

APT-Analysis

Microscopy examples

Further examinations

Surface analysis

In addition to the representation and analysis of surfaces, we also offer profile recordings to determine the layer system. We are not only at your side with the surface characterization, but can also change properties in a targeted manner.

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Material analysis

Thanks to our spark spectrometer, we can determine the chemical composition of materials down to the ppm range. Other investigation methods in our portfolio are, for example, microstructure analyzes using FIB-REM technology, X-ray diffraction analyzes or 3D tomography.

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